Coincident Gamma Ray Detection System Scintillation Detector - Department of Commerce

for Coincident gamma ray detection system, Scintillation Detector

BACKGROUND The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing. NIST seeks to procure two scintillation detectors, one for gamma rays, the other for combined neutron/gamma, and their associated photomultiplier tubes. These detectors will be used in the neutron/gamma field generated by a portable neutron generator and the irradiated sample environment. They will produce prompt gamma spectrum using a portable neutron generator-based prompt gamma activation analysis (PGAA) for quantitative elemental determination in semiconductor bulk material. NIST seeks to establish coincidence detection system to minimize

background gamma rays for improved signal to noise ratio and enhanced detection limit for critical elements in semiconductor material. In hopes to improve critical elements, especially light elements, such as H, B, N, in semiconductor material either intrinsic or added during manufacturing process can significantly affect the quality of the performance of the end product, in addition to metallic contaminants. PGAA is a unique non-destructive technique for quantitative analysis for these elements. PGAA is traditionally based on neutron beams from a nuclear reactor and therefore is less accessible to laboratory use. The proposed portable neutron generator-based PGAA, while 2 to 3 orders of magnitude lower in thermal neutron flux, can be suitable for elements of high capture cross sections, and through this project, demonstrate the potential for routine lab use that benefits the semiconductor industry. The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a solution that will achieve the specifications described below: Line Item 0001: Description: CeBr3 Scintillation Detector (2x3) Quantity: 1 Technical Specifications SCIONIX Model 51B76_2M-E1-CEBR-NEG; 51 mm diameter, 76 mm high CeBr3 scintillation crystal mounted in an aluminum housing, optically coupled to a 51 mm diameter PMT, surrounded by solid mu metal shield and equipped with a built-in voltage divider prepared for negative HV bias. Connectors include High voltage: SHV, Signal: BNC (anode), BNC (8th Dynode). Line Item 0002: Description: CLYC Scintillation Detector (2x2) Quantity: 1 Technical Specifications SCIONIX Model 51B51/2M-E1-CLYC-NEG; 51 mm diameter, 51 mm high CLYC:Ce scintillation crystal mounted in an aluminum housing, optically coupled to a 51 mm diameter PMT, surrounded by solid mu metal shield and equipped with a built-in voltage divider prepared for negative HV bias. Connectors include High voltage: SHV, Signal: BNC (anode), BNC (8th Dynode). HOW TO RESPOND TO THIS NOTICE In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response: Submit the response by email to the and, if specified, to the Secondary

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