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The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings for their CHIPS Metrology Program. These optics are required for ultrasensitive spectroscopy to detect trace impurities in gas-phase samples relevant to the semiconductor industry, with specific technical specifications for reflectivity, transmission, and operating conditions.
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Verify on SAM.govCombined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings Notice ID: NIST-SS26-CHIPS-158 Contract Opportunity Type: Sources Sought research in Grand Challenge 1, Metrology for Materials Purity, Properties and Provenance. To address this Grand Challenge, the project Optical Impurity Analysis of Semiconductor Gases for Enhanced Quality Systems seeks to purchase Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings to perform ultrasensitive cavity ring-down and cavity-enhanced spectroscopy on low-temperature (180 K to 220 K) gas-phase samples. The project is led by the Chemical Science Division of the NIST Material Measurement Laboratory, the nation’s premier metrology laboratory for measurement science, standards, technology, and data in the area of chemical sciences To improve sensitivity in laser absorption spectroscopy, optical cavities are used to enhance the interaction pathlength between a laser source and a gas-phase sample. Here we aim to detect trace impurities in gas-phase samples relevant to the semiconductor industry. Therefore, we require high reflectivity mirrors with low absorption and scattering loss that efficiently transmit and store laser light. The overall goal is the trace detection of small molecules like carbon dioxide (CO2) and carbon monoxide (CO) in bulk zero gases like CO2, nitrogen (N2) and argon (Ar) at the parts-per-trillion level (1 part in 1012). To achieve this goal, we seek Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings for Low Temperature for use at a center wavelength near 4500 nm and a temperature near 200 K Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings Quantity: Quantity six (6) Technical Specifications Center wavelength between 4450 nm and 4550 nm. Center wavelength achieved at a temperature between 180 K and 220 K. Mirrors operate with continuous-wave (CW) mid-infrared (mid-IR) lasers. Mirrors comprise a hybrid crystalline and ion beam sputtered coating. Crystalline coating component comprises alternating stacks of GaAs and AlGaAs. Mirror hybrid coating reflectivity shall be greater than or equal to 0.999 970 at center wavelength. Mirror hybrid coating transmission shall be less than or equal to 10 parts-per-million (ppm) at center wavelength. Coating diameter after transfer to substrate shall be between 15 mm and 18 mm. Coating applied to plano-concave silicon (Si) mirror substrates (supplied by NIST) of 25.4 mm diameter, 6.25 mm thickness, 1 m radius of curvature, and plano surface wedge angle of 0.5 degrees. Mirror high reflectivity, low loss hybrid coating shall be applied to the concave substrate face. An anti-reflection coating suitable for use from 4400 nm to 4600 nm shall be applied to the plano substrate face. NIST has not yet determined its acquisition strategy for this requirement and encourages interested sources to respond to this Notice. If NIST’s market research indicates there are alternative sources that are capable and interested in competing to fill this requirement, separate and apart from [ThorLabs INC VCJKYBSL8DL8] then NIST will consider conducting a competitive acquisition in accordance with law and regulation. To be clear, NIST’s identification of [Thorlabs INC] in this Notice does not constitute a binding commitment or obligation for it to conduct a sole source procurement with [Teledyne Princeton Instruments] for this requirement. Instructions for Responding to Respond to This Notice Parties that respond to this Notice are requested to voluntarily submit the requested information via email in Microsoft Word, Adobe PDF, and/or Microsoft Excel format to the designated point(s) of contact whose name and email address appears at the bottom of this notice. Please provide only the information requested by this Notice, and do not include proprietary, classified, confidential, or sensitive information in a response to this Notice. Information Requested in Response to This Notice: To help NIST with its market research, NIST is requesting that industry sources carefully review this notice and any
attachments to it and voluntarily provide the following information: Company Summary Notice Identification: Title of this posting. Corporate Details: Company name, physical address, website address, and Unique Entity Identifier (UEI).
Point of Contact (POC): Name, phone number, and email address. Company Size Standard: Your company’s size status relative to the NAICS code provided in this Notice. (Refer to the SBA Table of Small Business Size Standards). System for Award Management (SAM) Registration: Indicate whether your company has an active registration for procurement purposes in SAM.gov. Feedback for Draft
requirements/minimum specifications included with this Notice. Then, please provide suggestions to
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