Coincident Gamma Ray Detection System Using High Purity Germanium Detector - Commerce

for Coincident gamma ray detection system, High purity germanium detector,

BACKGROUND The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing. NIST seeks to procure a high purity germanium detector (HPGe) with cryo-cooling on transport cart with shielding sets and onboard efficiency calibration and software perpetual license. The detector system will be used in the neutron/gamma field generated by a portable neutron generator and the irradiated sample environment and connected by timing electronics with neutron/gamma detectors (separate procurement) for coincidence detection. Acquisition of high energy resolution prompt gamma spectrum from samples irradiated by thermal neutrons from a portable neutron generator and moderator, with absolute efficiency calibration for elemental quantification. This is essential to perform high energy resolution spectroscopy as a part of coincidence detection system to minimize

background gamma rays for improved signal to noise ratio and enhanced detection limit for critical elements in semiconductor material. Critical elements, especially light elements, such as H, B, N, in semiconductor material either intrinsic or added during manufacturing process can significantly affect the quality of the performance of the end product, in addition to metallic contaminants. PGAA is a unique non-destructive technique for quantitative analysis for these elements. PGAA is traditionally based on neutron beams from a nuclear reactor and therefore is less accessible to laboratory use. The proposed portable neutron generator-based PGAA, while 2 to 3 orders of magnitude lower in thermal neutron flux, can be suitable for elements of high capture cross sections, and through this project, demonstrate the potential for routine lab use that benefits the semiconductor industry. The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a solution that will achieve the specifications described below: Description: High purity Germanium detector with cryo-cooling and shielding Quantity: One (1) Technical Specifications N-type coaxial HPGe detector with on-board cryo-cooling. Endcap diameter 3.00”. Al endcap window. Efficiency > 25%. Energy resolution WHM at 1332 keV < 2 keV. Peak to Compton ratio > 50. Transistor reset preamplifier. Complete with transport cart and collimator shielding. Self-contained efficiency calibration based on detector geometry. HOW TO RESPOND TO THIS NOTICE In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response: Submit the response by email to the and, if specified, to the Secondary

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