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The Department of Energy is procuring a Milli-Kelvin Scanning Probe Microscope designed for atomic force microscopy and to support operations of scanning Microwave Impedance Microscopy and Scanning Resonator Microscopy at a base temperature of 20 mK. The instrument must operate within a fully shielded low noise environment and high vacuum.
The work involves the procurement of a specialized scientific instrument for advanced microscopy techniques.
a Milli-Kelvin Scanning Probe Microscope. The mK-SPM instrument, shall operate tuning-fork-based atomic force microscopy (TFAFM) and be designed to support optimum operation of scanning Microwave Impedance Microscopy (sMIM) and Scanning Resonator Microscopy (SRM) at a base temperature <= 20 mK inside a fully shielded low noise environment within high vacuum (HV). Mark Brock Contracting .O. Box 5000 (No Street Address
2) Upton, NY 11973 USA to this opportunity. B1 473768 Solicitation.pdf B1 Enclosure A Draft Contract.pdf B1 Enclosure B AMS-FORM-050.pdf B1 Enclosure C Quotation
Pricing Sheet.docx B1 Enclosure D ACH Authorization Form.pdf B1 Enclosure E_W9 Form.pdf
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