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The U.S. Army is procuring a J.A. Wollam IR-VASE® Mark II Infrared Variable Angle Spectroscopic Ellipsometer for materials characterization and thin-film analysis, requiring a single-source acquisition due to proprietary technology and unique performance specifications not available from other vendors.
Procurement of a J.A. Wollam IR-VASE® Mark II Infrared Variable Angle Spectroscopic Ellipsometer for advanced materials analysis, specifically for thin-film characterization and optical property measurement.
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